by Pat Hindle | Jul 21, 2026 | Test Solutions, Uncategorized
Mini-Circuits continues to drive innovation by offering high-performance, cost-effective instrumentation for the RF market. A recent example is the family of new RF dual-output RF signal generators...
by Pat Hindle | Jul 17, 2026 | Cables
There are many RF connections in modern RF systems and devices. Often, when designing an RF device or system, considerable attention is paid to selecting and evaluating various RF instruments. Sometimes overlooked but equally important are the RF interconnections: the...
by Pat Hindle | Jun 30, 2026 | Amplifiers
Bias Sequencing of Depletion Mode Devices Such as GaAs and GaN MMIC RF Power Amplifiers This application note (download pdf version here) provides a structured procedure to prepare and test depletion mode devices such as GaAs and GaN MMIC RF power amplifier (PA)...
by Pat Hindle | Jun 26, 2026 | Amplifiers, Engineering Resources
This application note complements our previous note, “Using Generalized Multi-Dimensional Data Files to Model Amplifier Temperature and DC Operating Point Dependence within the Amplifier2 Behavioral Model in ADS®”. Mini-Circuits characterizes its amplifiers across...
by Pat Hindle | Jun 25, 2026 | Adapters, Cables, Engineering Resources
Often the most overlooked part of any RF measurement is the high-frequency interconnections, including connectors, cables, and adapters. In this article, we will refer to the entire family as RF connectors. By exploring misconceptions about RF connectors, we can...
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