by Pat Hindle | Jul 21, 2026 | Test Solutions
Mini-Circuits continues to drive innovation by offering high-performance, cost-effective instrumentation for the RF market. A recent example is the family of new RF dual-output RF signal generators...
by Pat Hindle | Jun 30, 2026 | Amplifiers
Bias Sequencing of Depletion Mode Devices Such as GaAs and GaN MMIC RF Power Amplifiers This application note (download pdf version here) provides a structured procedure to prepare and test depletion mode devices such as GaAs and GaN MMIC RF power amplifier (PA)...
by minicircuitsadmin | Dec 2, 2025 | Amplifiers, Engineering Resources, Measurement Methods & Techniques, Videos
Mini-Circuits R&D Fellow, Joe Merenda recently presented a tutorial on Amplifier Additive Phase Noise at the 2025 Low-Level Radio Frequency Workshop at the Thomas Jefferson National Accelerator Facility in Newport News, VA. In this fourth episode of our Additive...
by jacquelineh96 | Jul 31, 2024 | Industry Insights, Videos
Justin Boyle, Global Market Manager at Mini-Circuits, talks with Pat Hindle from Microwave Journal about the markets and applications the company is supporting. The conversation featured some high-performance products recently released specifically in the Test &...
by jacquelineh96 | Mar 15, 2024 | Amplifiers, Measurement Methods & Techniques
Part 1: Background & Theory Optimum APM Test Configuration In our efforts to properly characterize the Additive Phase Modulation Noise (APM) and Additive Amplitude Modulation Noise (AAM) performance of MMIC amplifiers in our labs, Mini-Circuits is careful to...
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